CT Lab GX
產品說明
Introducing the CT Lab GX series, for ultra-high-speed, high-resolution 3D X-ray micro CT. Using the Sample-Stationary Method, these new devices can perform CT scans in 8 seconds at top speed, with a minimum resolution of 2.3 μm.
| Product name | CT Lab GX |
| Technique | X-ray computed tomography scanner |
| Benefit | Ultra-high-speed, high-resolution 3D X-ray micro CT |
| Technology | X-ray source with flat panel detector |
| Core attributes | Perform CT scans in 8 seconds at top speed, with a minimum resolution of 2.3 μm |
| Core options | 90 kV or 130 kV X-ray source |
| Computer | External PC, MS Windows® OS, |
| Core dimensions | 980 (W) x 1535 (H) x 963 (D) (mm) |
| Mass (core unit) | 450 kg |
| Power requirements | Varies with configuration |
產品特點
- BGA Crack檢測，如孔隙率、異物率，座標量測。
- IC晶片缺陷檢測，如孔洞、氣泡、層剝離、爆裂、空洞、打線完整性檢測。
- PCB製程中可能產生的缺陷，如﹕對齊不良或橋接以及開路。
- SMT焊點空洞現象檢測。
- 電源線中可能產生的斷線、短路等缺陷檢測。
- 錫球與晶片陣列封裝中錫球的完整性檢測。
- 晶片尺寸量測、打線線弧量測、元件吃錫面積比例量測。
- 航太、軍事、電池、合金、壓鑄、電子零件等缺陷檢測。
- 醫療器材、骨材、生醫材料等非破壞性檢測。
- 藥物、膠囊、藥錠、飲品等，內容物分布之非破壞性檢測。
- 塑膠材質破裂或金屬材質空洞檢測。
參考影片